Characteristics and Nano-measurements of Fullerene Embedded Si(111) surface using Scanning Probe Microscopy
博士 === 國立中興大學 === 物理學系所 === 99 === Elucidating the effect of size variation in nanoscale has also led to various and unique new physical and chemical properties in materials. Silicon carbide is one of the most important new-generation semiconducting materials, with important applications in vari...
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11868204203862785750 |