Effect of Nanohardness caused by the geometry of Nanoindenter tip

碩士 === 龍華科技大學 === 工程技術研究所 === 99 === In this study, the nanoindentation system and atomic force microscope (AFM) are integrated to improve the limitation of the present area function of nanoindentation test used for shallow depth. The projected areas under the shallow contact depth are modified thro...

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Bibliographic Details
Main Authors: Jhih-Hao Hong, 洪志豪
Other Authors: Kuen Ting
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/76033290435649881676