The Application of Low Voltage Electronic Load to the Characteristics Measurement of Solar Cells

• Main Authors: Chien-Te Chang, 張簡得
• Other Authors: Shih-Wei Kau
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/34752168039673581303

碩士 === 國立高雄應用科技大學 === 電機工程系 === 99 === This paper mainly aims to study the automatic measurement of single crystal silicon solar and polycrystalline silicon cell units. Through simulating sun light source and actual outdoor sunshine, relative electrical parameters of cell units have been measured and their characteristics will be analyzed according to the measurement results. System involves low voltage (below 1 Volt) electronic load and Zigbee wireless industrial network, programs with PC monitor, develops operation interface based on Windows, tests humanized design of software and records important parameters of basic unit of solar power cell such as I-V characteristic curve, power curve and Voc, Isc, Pm, Im, Vm etc. Used as a solar cell manufacturing plant package sorting according to quality control. Microchip PIC 16F877 microcontroller and Zigbee Wireless network components are used in the system. The former is used for data measurement, collection, transfer function, data storage, analysis function, adjusting measurement parameters, automatic/manual measurement compensation and remote control automatic recording; the latter, as automatic measurement for unit system, returns the measured signal to control center for processing through local area network. At the same time, remote control of wireless network is carried out. It is expected that defective rate of packaging finished goods will be lowered and products efficiency will be improved in solar power cell manufacturing industry.