Measuring the Capability of Process with Measurement Error

• Main Authors: Chiou, Yu Jen, 邱渝媜
• Other Authors: Yen, Ching Ho
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/25024156653500749652

碩士 === 華梵大學 === 工業工程與經營資訊學系碩士班 === 100 === In recent years, lots of research papers with process capability indices have been proposed for assessing process performance in the manufacturing industry, but have been comparatively neglected for those with the presence of measurement errors. In this paper, we consider the process capability measure based on the incapability index Cpp (Greenwich and Jahr-Schaffrath (1995)) in the presence of gauge measurement errors. We investigate the effects of measurement errors on the estimation of Cpp. In addition, the critical values are derived and the upper confidence bounds for true Cpp are constructed for testing process capability. This methodology is useful for the practitioners to judge the present process capability and ensure the process yield when measurement errors are unavoidable.