Development and Application of the Photoelectric Measuring Apparatuses for the Solar Cells

• Main Authors: Chao-Ting Wong, 翁兆廷
• Other Authors: 丁振卿
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/8x6d68

碩士 === 國立臺北科技大學 === 製造科技研究所 === 98 === This article is focused on discussing the home-made photoelectric measuring apparatuses including their comparison and calibration. The home-made photoelectric measuring apparatuses are further integrated with the graphical programming language of LabVIEW for automation measurements and also applied in measurements of the laboratorial developed dye sensitized nano solar cell(DSSC) as well as commercial amorphous Si based photovoltaic solar cell. This article builds a four-point probe instrument to measure the electric sheet resistance of ITO glass sintered at different temperature. Many materials of probe are tested and yields that the measured data with tungsten steel probe has the closest approach with the commercial instrument. Calibration of the measured position and measurements of ITO glass at different sintering temperature show that the ITO glass sintered at 400℃ has the lower electric sheet resistance. Moreover, this article also builds a measuring instrument of photoelectric conversion efficiency for analysis of DSSCs with different concentrations of commercial dye, natural dyes including lutein and anthocyanin as well as their mixtures. Adding dye in DSSC is to expand its absorption spectra and further to increase its total efficiency. This article builds a scanning spectrometer to analyse absorption spectrum of the solar cells and the incident photon-to-electron conversion efficiency(IPCE). The results show that the IPCE in the region of UV light is increased, the absorption spectrum is expanded to ca. 500nm, absorption spectrum of red shift is appeared for some dyes due to the added dye. As a whole, the photoelectric effect of DSSC is not occurred in the region of infrared light. This article further integrates the home-made IPCE instrument with LabVIEW and determines the best IPCE value of ca. 10.5% at 600nm for commercial amorphous Si based solar cell. The result agrees to the measured data with dual-channel meter. Furthermore, this article builds a Michelson interferometer integrated with LabVIEW to measure the film thickness of photoelectrode, which is coated by the spray technique in our CCT laboratory. The home-made Michelson interferometer is also finished with calibration and analysis.