Investigation of polarization conversion from an anisotropic thin film

• Main Authors: Wen-Pao Tsai, 蔡文堡
• Other Authors: Yi-Jun Jen
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/nv6j44

碩士 === 國立臺北科技大學 === 光電工程系研究所 === 98 === In this work, we describe the propagation behavior of wave in the birefringence material by Berreman calculus, and use it to confer what the reason to form the phenomenon of polarization conversion in the anisotropic thin film. The polarization conversion reflection (PCR) can be enhanced in the prism-coupling configuration (prism／anisotropic thin film／air). We use the Berreman calculus to gradually analysis the reflection coefficient, transmit coefficient and the distribution of electric- magnetic field at isotropic-crystal interface and crystal-isotropic interface, then watch out for the e-ray and o-ray in the anisotropic thin film. To observe above-mentioned variation of intensity and phase, we can differentiate what is the main factor about polarization conversion。 Reality, we substitute low refractive (SiO2) anisotropic thin film to consider taking a contrast for the cause of polarization that conversion between the incident angle of higher polarization conversion reflection and the lower one. And then, we substituted for high refractive (TiO2) anisotropic thin film once again。