Phenomenon of Local Contact Electrification studied by Scanning Probe Microscopy
碩士 === 東海大學 === 物理學系 === 98 === Contact electrification (CE) is the transfer of charge between two surfaces that are brought into contact, with or without friction and applied potential, they will exchange charge because of the work function difference or additional potential between metal to copoly...
Main Authors: | Jun-Rong Huang, 黃俊榮 |
---|---|
Other Authors: | Forest Shih-Sen Chien |
Format: | Others |
Language: | zh-TW |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/60580671286480182697 |
Similar Items
-
Scanning speed phenomenon in contact-resonance atomic force microscopy
by: Christopher C. Glover, et al.
Published: (2018-03-01) -
Contact resonance frequencies and their harmonics in scanning probe microscopy
by: Eduardo A. Murillo‐Bracamontes, et al.
Published: (2021-07-01) -
Local photocatalytic decomposition of self-assembled monolayers by scanning probe microscopy
by: Chun-Huang Chiang, et al.
Published: (2008) -
Investigation of a Contact Resonance Atomic Force Microscopy Scan Speed Phenomenon
by: Glover, Christopher Cash
Published: (2018) -
Computational studies in scanning probe microscopy
by: Williams, P. M.
Published: (1995)