Phenomenon of Local Contact Electrification studied by Scanning Probe Microscopy

• Main Authors: Jun-Rong Huang, 黃俊榮
• Other Authors: Forest Shih-Sen Chien
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/60580671286480182697

碩士 === 東海大學 === 物理學系 === 98 === Contact electrification (CE) is the transfer of charge between two surfaces that are brought into contact, with or without friction and applied potential, they will exchange charge because of the work function difference or additional potential between metal to copolymer. The details of how CE happens on the nanometer scale are still not understood. So we study the interactional behavior of local surface charge between metal and polymer using the SPM probe (Cr/Pt coating). We used SPM probe to rub the polymer by changed tip bias and tip speed, and then used electrostatic force microscopy (EFM) to detect the charge distribution. We found that the contact charges must be decayed when the tip speed increased. But the contact charges increased with the tip bias. We almost found no CE occurs at the polymer in some particular tip bias and speed. It implies that the surface potential of probe were equal to copolymer’s. In this study, the EFM shows the CE in the nanometer scale, and the contact charges have relations with tip bias (electric field) and tip speed (friction).