Study on 3D surface profile measurement
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 98 === In this paper, we introduce a reflection-type profilometer which is a novel technique for measuring the large surface profile of a test plate using a CCD a array. In order to save time and rapidly observe the whole profile, therefore, large area measurement...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/u37j7c |