The Comprehension of the Model of Atomic Force Microscope by Junior High School Students

• Main Authors: Yu-Kai Hung, 洪裕凱
• Other Authors: Huei-Ying Ho
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/86258561950984494732

碩士 === 國立臺北教育大學 === 自然科學教育學系碩士班 === 98 === New tools or instruments helps drive scientific progress immensely. Recently, AFM (atomic force microscope) have been developed that have rendered the nanoscale world accessible. The purpose of this study is a middle school teacher intending to teach with AFM model to enchance 9th graders to understand the principle and the application of AFM for exploring the epistemology of nanoworld. There are 32 ninth-grade junior high students participating in this teaching with AFM model learning activity. In order to understand the effectiveness of AFM model teaching, the comprehension test and semi-structured interviews are taken to evaluate the learning results. Although there is no significant relationship between the effectiveness of AFM model teaching and comprehension test, the impression of AFM model on students’ minds deeply motivates them to learn nanotechnology, particularly, for low achievers in science appear promising in designing model work. Implications and suggestions would further provide science educators the references to implement the innovative science curriculum.