The Comprehension of the Model of Atomic Force Microscope by Junior High School Students

碩士 === 國立臺北教育大學 === 自然科學教育學系碩士班 === 98 === New tools or instruments helps drive scientific progress immensely. Recently, AFM (atomic force microscope) have been developed that have rendered the nanoscale world accessible. The purpose of this study is a middle school teacher intending to teach with A...

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Bibliographic Details
Main Authors: Yu-Kai Hung, 洪裕凱
Other Authors: Huei-Ying Ho
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/86258561950984494732