Effect of applying electric bias at different thermal stages on the properties of PZT thin films with distinct Zr/Ti ratios
碩士 === 國立清華大學 === 材料科學工程學系 === 98 === 本實驗以溶膠凝膠法配置不同Zr/Ti比例之鋯鈦酸鉛(PZT)溶液,以旋鍍方式鍍於Pt/ TiOx/ SiO2/ Si基板,並在鐵電薄膜退火過程中階段性的施加垂直膜面的正負電場,探討在不同階段下施加電場對薄膜特性的影響。本實驗施加於試片之電場約為333KV/cm,遠大於文獻中所提及之電場強度及矯頑電場。 實驗結果顯示,隨著不同成分及不同的加電場條件,均會對其薄膜優選方向、顯微結構以及鐵電特性等有所影響。在Zr/Ti比例為Zr55時,隨著不同的電場條件其優選方向隨之改變;在Holding時施加電場,薄膜趨向random;在...
Main Authors: | Liu, Jung-Hsiu, 劉容秀 |
---|---|
Other Authors: | Hu, Chen-Ti |
Format: | Others |
Language: | en_US |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/06769948224193390974 |
Similar Items
-
Sputtered Pb(Zr₀.₅₂Ti₀.₄₈)O₃ (PZT) thin films on copper foil substrates
by: Walenza-Slabe, Joel
Published: (2013) -
Studies on the PZT prepared from ZrTiO��
by: LIN, WENDY, et al.
Published: (1992) -
Pb(Zr,Ti)O3 (PZT) Thin Film Sensors for Fully-Integrated, Passive Telemetric Transponders
by: Richard X. FU, et al.
Published: (2011-04-01) -
The Investigation of Reliability in PbZrTiO3 (PZT) Ferroelectric Capacitor
by: Ching-Ting Yen, et al.
Published: (2002) -
Structural and electrical characterization of La3+ substituted PMS-PZT (Zr/Ti:60/40) ceramics
by: Menasra H., et al.
Published: (2018-05-01)