Simulation of High Electron Concentration Channel Field-Effect Transistors
碩士 === 國立彰化師範大學 === 電子工程學系 === 98 === The purpose of this thesis is to simulate the high electron density channel field-effect transistor (FET). Based on the high electron mobility transistor (HEMT) with a high electron concentration InAsSb channel, we simulate the influences of the antimony (Sb) co...
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ndltd-TW-098NCUE54280052015-11-04T04:01:42Z http://ndltd.ncl.edu.tw/handle/29112212121772608336 Simulation of High Electron Concentration Channel Field-Effect Transistors 高電子濃度通道場效電晶體之模擬 Hung-Kui Lai 賴宏奎 碩士 國立彰化師範大學 電子工程學系 98 The purpose of this thesis is to simulate the high electron density channel field-effect transistor (FET). Based on the high electron mobility transistor (HEMT) with a high electron concentration InAsSb channel, we simulate the influences of the antimony (Sb) composition in the channel on the device characteristics. Additionally, we study the FET structure with an Al channel. It’s found that when the thickness of the Al channel is decreased to the scale of several atomic layers, the quantum confinement effect can effectively reduce the electron concentration. Jenq-Shinn Wu 吳 正 信 2010 學位論文 ; thesis 31 zh-TW |
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碩士 === 國立彰化師範大學 === 電子工程學系 === 98 === The purpose of this thesis is to simulate the high electron density channel field-effect transistor (FET). Based on the high electron mobility transistor (HEMT) with a high electron concentration InAsSb channel, we simulate the influences of the antimony (Sb) composition in the channel on the device characteristics. Additionally, we study the FET structure with an Al channel. It’s found that when the thickness of the Al channel is decreased to the scale of several atomic layers, the quantum confinement effect can effectively reduce the electron concentration.
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Jenq-Shinn Wu |
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Jenq-Shinn Wu Hung-Kui Lai 賴宏奎 |
author |
Hung-Kui Lai 賴宏奎 |
spellingShingle |
Hung-Kui Lai 賴宏奎 Simulation of High Electron Concentration Channel Field-Effect Transistors |
author_sort |
Hung-Kui Lai |
title |
Simulation of High Electron Concentration Channel Field-Effect Transistors |
title_short |
Simulation of High Electron Concentration Channel Field-Effect Transistors |
title_full |
Simulation of High Electron Concentration Channel Field-Effect Transistors |
title_fullStr |
Simulation of High Electron Concentration Channel Field-Effect Transistors |
title_full_unstemmed |
Simulation of High Electron Concentration Channel Field-Effect Transistors |
title_sort |
simulation of high electron concentration channel field-effect transistors |
publishDate |
2010 |
url |
http://ndltd.ncl.edu.tw/handle/29112212121772608336 |
work_keys_str_mv |
AT hungkuilai simulationofhighelectronconcentrationchannelfieldeffecttransistors AT làihóngkuí simulationofhighelectronconcentrationchannelfieldeffecttransistors AT hungkuilai gāodiànzinóngdùtōngdàochǎngxiàodiànjīngtǐzhīmónǐ AT làihóngkuí gāodiànzinóngdùtōngdàochǎngxiàodiànjīngtǐzhīmónǐ |
_version_ |
1718124299537088512 |