Built-In Diagnostic Data Compression Techniques for Random Access Memories
碩士 === 國立中央大學 === 電機工程研究所 === 98 === Yield and reliability are two very critical challenges for modern random access memories (RAMs). With the shrinking transistor size and aggressive design rules, RAMs are easily prone to severe yield and reliability problems. Therefore, efficient reliability-enhan...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/93842701866134509805 |