Analysis of Flexible Organic Thin-Film Transistors under Bending Strains
碩士 === 國立交通大學 === 顯示科技研究所 === 98 === In this study, we fabricated flexible organic thin-film transistors on stainless steel substrates, and their electrical characteristic were measured under different bending conditions. We found that the electrical characteristic was increased under compressed str...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/10664551643855492895 |
id |
ndltd-TW-098NCTU5812122 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-098NCTU58121222016-04-18T04:21:37Z http://ndltd.ncl.edu.tw/handle/10664551643855492895 Analysis of Flexible Organic Thin-Film Transistors under Bending Strains 可撓式有機薄膜電晶體在彎曲應力下的電性探討 Chen, Tzung-Da 陳宗達 碩士 國立交通大學 顯示科技研究所 98 In this study, we fabricated flexible organic thin-film transistors on stainless steel substrates, and their electrical characteristic were measured under different bending conditions. We found that the electrical characteristic was increased under compressed strain and decreased under tensile strain. From the analysis of the results, we deduced that the variety of intermolecular force change the device characteristic under bending strain states. mechanical strains influence the barrier height between the grains of pentacene thin-films, thereby resulting in the variation of device characteristic. Chen, Fang-Chung 陳方中 2010 學位論文 ; thesis 58 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 國立交通大學 === 顯示科技研究所 === 98 === In this study, we fabricated flexible organic thin-film transistors on stainless steel substrates, and their electrical characteristic were measured under different bending conditions. We found that the electrical characteristic was increased under compressed strain and decreased under tensile strain. From the analysis of the results, we deduced that the variety of intermolecular force change the device characteristic under bending strain states. mechanical strains influence the barrier height between the grains of pentacene thin-films, thereby resulting in the variation of device characteristic.
|
author2 |
Chen, Fang-Chung |
author_facet |
Chen, Fang-Chung Chen, Tzung-Da 陳宗達 |
author |
Chen, Tzung-Da 陳宗達 |
spellingShingle |
Chen, Tzung-Da 陳宗達 Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
author_sort |
Chen, Tzung-Da |
title |
Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
title_short |
Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
title_full |
Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
title_fullStr |
Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
title_full_unstemmed |
Analysis of Flexible Organic Thin-Film Transistors under Bending Strains |
title_sort |
analysis of flexible organic thin-film transistors under bending strains |
publishDate |
2010 |
url |
http://ndltd.ncl.edu.tw/handle/10664551643855492895 |
work_keys_str_mv |
AT chentzungda analysisofflexibleorganicthinfilmtransistorsunderbendingstrains AT chénzōngdá analysisofflexibleorganicthinfilmtransistorsunderbendingstrains AT chentzungda kěnáoshìyǒujībáomódiànjīngtǐzàiwānqūyīnglìxiàdediànxìngtàntǎo AT chénzōngdá kěnáoshìyǒujībáomódiànjīngtǐzàiwānqūyīnglìxiàdediànxìngtàntǎo |
_version_ |
1718226985885368320 |