The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device

碩士 === 國立交通大學 === 工學院碩士在職專班精密與自動化工程組 === 98 === Technology advancement, IC chip need to own the features of light weight, ultra thin, short, small and high performance, huge memory capacity as well. To achieve huge capacity, chip need to be ground to 75μm, some are even need to reach 25μm before die...

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Main Authors: Jao, Chun-Lung, 饒俊龍
Other Authors: Cheng, Pi-Ying
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/43892366813513409613
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spelling ndltd-TW-098NCTU51460182016-04-18T04:21:30Z http://ndltd.ncl.edu.tw/handle/43892366813513409613 The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device 黏晶機頂針機構之最佳設計與實作 Jao, Chun-Lung 饒俊龍 碩士 國立交通大學 工學院碩士在職專班精密與自動化工程組 98 Technology advancement, IC chip need to own the features of light weight, ultra thin, short, small and high performance, huge memory capacity as well. To achieve huge capacity, chip need to be ground to 75μm, some are even need to reach 25μm before die stacking. Si chip are still mounted on the dicing tape after cutting and which requires die bonder to eject the chip. During the ejection process, thin Si chip are easily to crack by the contacting method and casus discard. In IC assembly, Die Bonder ejection process is the key point of through- put. The thesis use ANSYS to research on the damage during thin chip ejection process. In the meantime, select Taguchi experiment to carry on contrast to figure out the best design of ejection pin arrangement and recipe. Consequently, reduce the die crack and improve through- put from 60% to 95.31%.Believe this research would be helpful on related production and process analysis. Cheng, Pi-Ying 鄭璧瑩 2010 學位論文 ; thesis 94 zh-TW
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language zh-TW
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description 碩士 === 國立交通大學 === 工學院碩士在職專班精密與自動化工程組 === 98 === Technology advancement, IC chip need to own the features of light weight, ultra thin, short, small and high performance, huge memory capacity as well. To achieve huge capacity, chip need to be ground to 75μm, some are even need to reach 25μm before die stacking. Si chip are still mounted on the dicing tape after cutting and which requires die bonder to eject the chip. During the ejection process, thin Si chip are easily to crack by the contacting method and casus discard. In IC assembly, Die Bonder ejection process is the key point of through- put. The thesis use ANSYS to research on the damage during thin chip ejection process. In the meantime, select Taguchi experiment to carry on contrast to figure out the best design of ejection pin arrangement and recipe. Consequently, reduce the die crack and improve through- put from 60% to 95.31%.Believe this research would be helpful on related production and process analysis.
author2 Cheng, Pi-Ying
author_facet Cheng, Pi-Ying
Jao, Chun-Lung
饒俊龍
author Jao, Chun-Lung
饒俊龍
spellingShingle Jao, Chun-Lung
饒俊龍
The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
author_sort Jao, Chun-Lung
title The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
title_short The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
title_full The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
title_fullStr The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
title_full_unstemmed The Investigation and Evaluation on Mechanism Optimization of Chip Pickup Device
title_sort investigation and evaluation on mechanism optimization of chip pickup device
publishDate 2010
url http://ndltd.ncl.edu.tw/handle/43892366813513409613
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