Spatial Testing and Spatial Clustering with Applications to Wafer Bin Map and Functional MRI Data
碩士 === 國立成功大學 === 統計學系碩博士班 === 98 === Spatial smoothing, spatial testing, and spatial clustering are often applied to determine the spatial dependence and find the important spatial region in the field of image analysis. In this thesis, we will modify the above statistical methods to analysis two re...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/20976023015398987194 |