Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants

碩士 === 國立勤益科技大學 === 工業工程與管理系 === 98 === After 20 years development of the semiconductor industry in Taiwan, the structure of industrial is already not only quite complete, but also packaging and testing of the semiconductor. After more than a dozen years of high growth and rapid expansion in Taiwa...

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Main Authors: Chung-Chi Hung, 洪鐘棋
Other Authors: Dr. He-Yau Kang
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/32242563118016311296
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spelling ndltd-TW-098NCIT50310352016-04-04T04:16:51Z http://ndltd.ncl.edu.tw/handle/32242563118016311296 Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants 運用FANP和ISM於半導體封測廠機台之評估與選擇 Chung-Chi Hung 洪鐘棋 碩士 國立勤益科技大學 工業工程與管理系 98 After 20 years development of the semiconductor industry in Taiwan, the structure of industrial is already not only quite complete, but also packaging and testing of the semiconductor. After more than a dozen years of high growth and rapid expansion in Taiwan's IC packaging and testing firms, the suppliers now rank among the world's first. Under this consider, how do the test plants identify the factors of selection test machines effectively so that to follow as often as the selection of machines. We must consider first the following: such as the requirements of customer, capacities, qualities, costs, successful technology transfer, etc. for stable the competitive advantage and potential of company in the future. In the face of such multi-criteria issue, this paper will suggest an effective and objective decision making method in the selection of three types testing machines in the testing plants. During the process a Analytic Network Process (ANP), fuzzy theory and Interpretive Structural Modeling (ISM) model is applied which consult the views of academics and industry professionals, and use the method of the pair-wise comparison of the each hierarchy weights and consider the role of each level so that to calculate with all levels by the index weight, and ranking the priorities of the solutions to propose the suggestions for the decision makers. Dr. He-Yau Kang 康鶴耀 2010 學位論文 ; thesis 91 zh-TW
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language zh-TW
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description 碩士 === 國立勤益科技大學 === 工業工程與管理系 === 98 === After 20 years development of the semiconductor industry in Taiwan, the structure of industrial is already not only quite complete, but also packaging and testing of the semiconductor. After more than a dozen years of high growth and rapid expansion in Taiwan's IC packaging and testing firms, the suppliers now rank among the world's first. Under this consider, how do the test plants identify the factors of selection test machines effectively so that to follow as often as the selection of machines. We must consider first the following: such as the requirements of customer, capacities, qualities, costs, successful technology transfer, etc. for stable the competitive advantage and potential of company in the future. In the face of such multi-criteria issue, this paper will suggest an effective and objective decision making method in the selection of three types testing machines in the testing plants. During the process a Analytic Network Process (ANP), fuzzy theory and Interpretive Structural Modeling (ISM) model is applied which consult the views of academics and industry professionals, and use the method of the pair-wise comparison of the each hierarchy weights and consider the role of each level so that to calculate with all levels by the index weight, and ranking the priorities of the solutions to propose the suggestions for the decision makers.
author2 Dr. He-Yau Kang
author_facet Dr. He-Yau Kang
Chung-Chi Hung
洪鐘棋
author Chung-Chi Hung
洪鐘棋
spellingShingle Chung-Chi Hung
洪鐘棋
Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
author_sort Chung-Chi Hung
title Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
title_short Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
title_full Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
title_fullStr Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
title_full_unstemmed Applying the ANP and ISM in the machines evaluation and selection for the semiconductor packaging and testing plants
title_sort applying the anp and ism in the machines evaluation and selection for the semiconductor packaging and testing plants
publishDate 2010
url http://ndltd.ncl.edu.tw/handle/32242563118016311296
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