Study on the Instability of Low Temperature Poly-Si Thin Film Transistors Operated in OFF-State
碩士 === 國立中興大學 === 電機工程學系所 === 98 === LTPS (Low Temperature Poly-Si) TFTs have been widely used recently. Therefore, the study of LTPS TFTs reliability is one of the most important issues. When the LPTS TFTs were worked on the liquid crystal display, the TFT’s On/Off states are controlled by AC signa...
Main Authors: | Sheng-Jen Lai, 賴聖荏 |
---|---|
Other Authors: | 劉漢文 |
Format: | Others |
Language: | zh-TW |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/19814488705759323407 |
Similar Items
-
Study on Process Effects and Bias Temperature Instability of Poly-Si Thin-Film Transistors
by: Tong-Yi Wang, et al.
Published: (2007) -
Study on the Reliability of N-Channel Low Temperature Poly-Si Thin Film Transistors Dynamically Operated in OFF Region
by: Jhih-Yuan Wang, et al. -
Study on the Instability of Low Temperature Poly-Si Thin Film Transistors under DC and AC Stress
by: Jie-Sung Lin, et al. -
Process and Simulation of Low Temperature Poly-Si Thin Film Transistor
by: Chou Ruey-Yuan, et al.
Published: (2000) -
Investigation and Application of Low Temperature Poly-Si Thin Film Transistors
by: Yi-Yan Lin, et al.
Published: (2012)