A Redundant Fault Tolerant Method by Using CVSL Logic

碩士 === 國立中興大學 === 資訊科學與工程學系所 === 98 === For the deep sub-nanometer manufacturing process, the fault tolerant processing issue has been becoming more and more important than before. There are a number of technologies have been propose to improve the process yield by using many other different metho...

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Bibliographic Details
Main Authors: Kuo-Ming Huang, 黃國明
Other Authors: 黃德成
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/61618109521513474911