Shadow Moire Profilometry

• Main Authors: Yo-Wei Chen, 陳佑威
• Other Authors: 李吉群
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/51260091131506415658

碩士 === 國立中興大學 === 機械工程學系所 === 98 === 　　When the specimen was examined through the grating, the lines of the grating were observed, as well as the changes of the grating’s shadow according to the specimen’s profilometry. The lines and shadows from the grating together produced a moire fringe pattern; it is called a shadow moire pattern. The method of calculating the profilometry using the moire is called the shadow moire. This research was to measure a specimen’s profilometry using the phase shift technique according to shadow moire. 　　This research proposes that using the flatbed scanner to record shadow moire pattern will reduce the noise on the recorded images. A flatbed scanner is an inexpensive and easily obtained high quality digital image recorder that records images. Furthermore, the entire specimen’s profilometry can be calculated by the phase shift technique and the phase-unwrap technique. 　　The ±137μm white board was chosen to be specimen in order to let grating’s shadow to fall on specimen in this research. The last research results were compared by the measurements of Profilometry from CMM and Laser probe. The uncertainty was claculated from this result.