Development and Application of Thin Film Optical Inspection Technology

碩士 === 明志科技大學 === 機電工程研究所 === 98 === The development of optical inspection technique has been booming over recent years, and both the optical elements and thin films can be tested in their surface roughness and recrystallization characterization with optical inspection technology. This paper is aime...

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Bibliographic Details
Main Authors: Chin-Sheng Chao, 趙金聖
Other Authors: Chil-Chyuan Kuo
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/32767433657804808985