The Affection of Voltage Sag on Magnetic Contactors and the Countermeasures

• Main Authors: Kuo-Hsiang, Chen, 甄國祥
• Other Authors: Jau-Ji, Jou
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/75030019867452573444

碩士 === 國立高雄應用科技大學 === 電子工程系 === 98 === ABSTRACT Power quality is one of the key issues for the power companies and industrial users. Poor power quality could cause long-term and immediate damages. Within the power quality problems, voltage sag is the major cause of tripping sensitive devices or equipments. This phenomenon is probably due to a system grid failure, system overload or high starting voltage of large motors, causing voltage sag on upper power stream of the affected devices or equipments. At present, many international organizations and industrial unions have developed voltage sag on load tolerance curves (Ride-through Curve) , e.g. Computer Business Equipment Manufacture Association (CBEMA) curves、Information Technology Industry Council (ITIC) curves and Semiconductor Equipment and Materials International Group (SEMI ) curves. In this study, based on the definition and specification of SEMI F47 provisions for semiconductor processing equipments, several types of magnetic contactors were analyzed. Results of the conducted tests for the different rated magnetic contactors, statistical data and analysis information on the voltage sag and countermeasures can be used as a reference for industries. Keywords：Voltage Sag, Magnetic Contactors, SEMI F47