The Quality Improvement of PI Coating Process of TFT-LCD Panels with Taguchi Methods

• Main Authors: SHUN-JEN SHIH, 施順仁
• Other Authors: none
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/17065941128404736582

碩士 === 逢甲大學 === 資訊電機工程碩士在職專班 === 98 === This study applied Taguchi methods to improve the quality of PI (polyimide) coating processes for TFL-LCD (thin-film transistor liquid-crystal display) panels, which could prevent low yield due to adjustments of cleaning machine brush indentation for chipping. The optimal process conditions was obtained by the Taguchi Methods in order that alignment film printing can achieve the best product quality at the lowest cost. This study generated a fish-bone diagram to determine quality characteristic factors, and chose the experimental factors determined as the most appropriate orthogonal array. Experiments were conducted, based on a number of defects on printed alignment film, for the impacts of various conditions of Taguchi experiments on quality. The Fourier analysis was performed in an optical inspection machine to determine the defects in the deposition of an alignment film layer. This study employed the Taguchi method to improve alignment film printing process parameters and production yield, and control a cell particle derived long-term product scrap level below 0.2%, as well as lower NG and line repair probabilities.