Design of High Sensitivity near-field probe and Analysis of probe Calibration
碩士 === 逢甲大學 === 產業研發碩士班 === 98 === Many extremely susceptible components with low-voltage operation or high sensitivity may be affected by EMI noises and degrade their performance. As a consequence, the EMI phenomena from IC have become an issue for semiconductor industrial, such as IC design, IC pa...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73759780342956080650 |