Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment

碩士 === 中原大學 === 機械工程研究所 === 98 === Currently larger panels are manufactured in the TFT-LCD (Thin Film Transistor-Liquid Crystal Display) fabs and, moreover, the semiconductor manufacturing technology, following Moore's Laws, is developed for reduced feature size, larger wafer size, and higher d...

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Main Authors: Chia-Hsien Ko, 柯佳賢
Other Authors: Justin Chang
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/10829491442899454915
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spelling ndltd-TW-098CYCU54890232015-10-13T13:43:19Z http://ndltd.ncl.edu.tw/handle/10829491442899454915 Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment 應用類神經網路與模糊分群法偵測化學氣相沈積之設備故障 Chia-Hsien Ko 柯佳賢 碩士 中原大學 機械工程研究所 98 Currently larger panels are manufactured in the TFT-LCD (Thin Film Transistor-Liquid Crystal Display) fabs and, moreover, the semiconductor manufacturing technology, following Moore's Laws, is developed for reduced feature size, larger wafer size, and higher device integration. As the fabrication process comes into the ULSI era, process control becomes more important. The purpose of fault detection of fabrication process is to increase the utility rate of equipment and to improve the product quality. In order to maintain competitive production capacity and product quality, process fault detection is a very important issue. This thesis studies the thin-film fabrication in the array process of TFT-LCD. Data obtained from the RF supply system of PECVD is studied. This proposed fault detection tool will capture the characteristics of RF signals using Kohonen competitive network and Fuzzy C Means. Then, the secure and warning areas of training model are defined by ellipsoidal calculus. This constructed model can be utilized to detect any malfunctions and faults occurred during the semiconductor manufacturing. In our experiment, 22 sets of normal data were used as the training data for Kohonen network and, furthermore, these obtained feature neurons were classified into two groups by Fuzzy C Means in order to filter out the scattered neurons. Then, the secure and the warning areas of training model were calculated by the ellipsoidal calculus. Next, 10 sets of normal data were used to test the generalization of the training model. If any erroneous judgments occur, the model must be re-trained by adding these data for improving the generalization. Finally, four different kinds of faults, including chamber, solenoid valve, matching box and generator, were examined using 9 sets of data per faulty type. The feasibility of fault detection tool was verified. Justin Chang 張耀仁 2010 學位論文 ; thesis 71 zh-TW
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description 碩士 === 中原大學 === 機械工程研究所 === 98 === Currently larger panels are manufactured in the TFT-LCD (Thin Film Transistor-Liquid Crystal Display) fabs and, moreover, the semiconductor manufacturing technology, following Moore's Laws, is developed for reduced feature size, larger wafer size, and higher device integration. As the fabrication process comes into the ULSI era, process control becomes more important. The purpose of fault detection of fabrication process is to increase the utility rate of equipment and to improve the product quality. In order to maintain competitive production capacity and product quality, process fault detection is a very important issue. This thesis studies the thin-film fabrication in the array process of TFT-LCD. Data obtained from the RF supply system of PECVD is studied. This proposed fault detection tool will capture the characteristics of RF signals using Kohonen competitive network and Fuzzy C Means. Then, the secure and warning areas of training model are defined by ellipsoidal calculus. This constructed model can be utilized to detect any malfunctions and faults occurred during the semiconductor manufacturing. In our experiment, 22 sets of normal data were used as the training data for Kohonen network and, furthermore, these obtained feature neurons were classified into two groups by Fuzzy C Means in order to filter out the scattered neurons. Then, the secure and the warning areas of training model were calculated by the ellipsoidal calculus. Next, 10 sets of normal data were used to test the generalization of the training model. If any erroneous judgments occur, the model must be re-trained by adding these data for improving the generalization. Finally, four different kinds of faults, including chamber, solenoid valve, matching box and generator, were examined using 9 sets of data per faulty type. The feasibility of fault detection tool was verified.
author2 Justin Chang
author_facet Justin Chang
Chia-Hsien Ko
柯佳賢
author Chia-Hsien Ko
柯佳賢
spellingShingle Chia-Hsien Ko
柯佳賢
Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
author_sort Chia-Hsien Ko
title Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
title_short Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
title_full Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
title_fullStr Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
title_full_unstemmed Applying Artificial Neural Networks and Fuzzy Clustering Method for Fault Detection of CVD Equipment
title_sort applying artificial neural networks and fuzzy clustering method for fault detection of cvd equipment
publishDate 2010
url http://ndltd.ncl.edu.tw/handle/10829491442899454915
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