Applying Statistical Measurement System Analysis to the Quality Improvement Process of Polarizer

• Main Authors: Ching-Hui Huang, 黃景暉
• Other Authors: Kuo-Hwa Chang
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/eqmshm

碩士 === 中原大學 === 工業與系統工程研究所 === 98 === Polarizer is a key component and plays an important role in LCD; however, that is because of polarizer composed by a number of variant function films, for example, like, DBEF , wide film, TAC and so on. Nevertheless, these crucial films and technologies are dominated by Japanese firms almost, and also possess the highest of marketing share in TFT-LCD field. In the past, Polarizer manufacturer always train staff when leakage had happened , but it not effective solution. Through this research, in major study the back-production process and inspection process of polarizer. With the approach of Statistical Measurement System Analysis, the variations of appraisers or equipment are be analyzed. After improvement , the value of kappa for All Appraiser vs. standard was from 0.698622 to 0.939633. It make higher accuracy to inspect Polarizer. From a view point of cost, it cost $528,000 USD to maintain base on the input quantity and cost of Polarizer in 2009. By the way of combine industry with science, It raise competitiveness of company in future.