Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing

碩士 === 元智大學 === 資訊工程學系 === 97 === Large test data volume and excessive testing power are two strict challenges for today’s VLSI testing. This thesis presents a BIST-based method for reducing testing power. A low power test set is first determined through the application of minimum transition filling...

Full description

Bibliographic Details
Main Authors:	Chi-Wei Yu, 游濟維
Other Authors:	Wang-Dauh Tseng
Format:	Others
Language:	en_US
Published:	2009
Online Access:	http://ndltd.ncl.edu.tw/handle/67361267667834633583

id	ndltd-TW-097YZU05392051
record_format	oai_dc
spelling	ndltd-TW-097YZU053920512016-05-04T04:17:09Z http://ndltd.ncl.edu.tw/handle/67361267667834633583 Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing 決定式內嵌式自我測試架構下藉由多重線性回饋移位暫存器達到低功率測試 Chi-Wei Yu 游濟維碩士元智大學資訊工程學系 97 Large test data volume and excessive testing power are two strict challenges for today’s VLSI testing. This thesis presents a BIST-based method for reducing testing power. A low power test set is first determined through the application of minimum transition filling (MTF) on the test cubes. The technique of Neighboring Bit-wise Exclusive-OR (NB-XOR) Transform is applied to pre-process the test data to help improve the compression effect. A BIST-based scheme using multiple LFSRs is then constructed to compress test data and generate the target test set. Experimental results show, this method can reduce the shift-in power significantly and also has good compression effect for larger ISCAS’89 benchmark circuits. Wang-Dauh Tseng 曾王道 2009 學位論文 ; thesis 19 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 元智大學 === 資訊工程學系 === 97 === Large test data volume and excessive testing power are two strict challenges for today’s VLSI testing. This thesis presents a BIST-based method for reducing testing power. A low power test set is first determined through the application of minimum transition filling (MTF) on the test cubes. The technique of Neighboring Bit-wise Exclusive-OR (NB-XOR) Transform is applied to pre-process the test data to help improve the compression effect. A BIST-based scheme using multiple LFSRs is then constructed to compress test data and generate the target test set. Experimental results show, this method can reduce the shift-in power significantly and also has good compression effect for larger ISCAS’89 benchmark circuits.
author2	Wang-Dauh Tseng
author_facet	Wang-Dauh Tseng Chi-Wei Yu 游濟維
author	Chi-Wei Yu 游濟維
spellingShingle	Chi-Wei Yu 游濟維 Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
author_sort	Chi-Wei Yu
title	Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
title_short	Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
title_full	Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
title_fullStr	Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
title_full_unstemmed	Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing
title_sort	deterministic built-in self-test using multiple linearfeedback shift registers for low-power scan testing
publishDate	2009
url	http://ndltd.ncl.edu.tw/handle/67361267667834633583
work_keys_str_mv	AT chiweiyu deterministicbuiltinselftestusingmultiplelinearfeedbackshiftregistersforlowpowerscantesting AT yóujìwéi deterministicbuiltinselftestusingmultiplelinearfeedbackshiftregistersforlowpowerscantesting AT chiweiyu juédìngshìnèiqiànshìzìwǒcèshìjiàgòuxiàjíyóuduōzhòngxiànxìnghuíkuìyíwèizàncúnqìdádàodīgōnglǜcèshì AT yóujìwéi juédìngshìnèiqiànshìzìwǒcèshìjiàgòuxiàjíyóuduōzhòngxiànxìnghuíkuìyíwèizàncúnqìdádàodīgōnglǜcèshì
_version_	1718256533884633088

Deterministic Built-in Self-Test Using Multiple LinearFeedback Shift Registers for Low-Power Scan Testing

Similar Items