The risk assessment & abnormal event analysis of facility gas & chemical supply system in wafer process

碩士 === 元智大學 === 化學工程與材料科學學系 === 97 === The central (gas/chemical) supply systems of wafer factory were studied by analysis abnormal events. This paper refers to this wafer factory characteristic using the FMEA method to set up the boundary condition of risk assessment. This research emphasizes on ex...

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Bibliographic Details
Main Authors: Ting-Jui Chang, 張庭瑞
Other Authors: Jenn-Chiu Hwang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/55559538083136222260
Description
Summary:碩士 === 元智大學 === 化學工程與材料科學學系 === 97 === The central (gas/chemical) supply systems of wafer factory were studied by analysis abnormal events. This paper refers to this wafer factory characteristic using the FMEA method to set up the boundary condition of risk assessment. This research emphasizes on exploring and analyzing the frequency and causes by used FMEA risk assessment of the abnormal events. Follow the final conclusion of the study will can to prevent and improve for reduction of abnormal rate and reference of troubleshooting.