Developing Prediction Model for Wafer Acceptance Test — For Capacitance
碩士 === 元智大學 === 工業工程與管理學系 === 97 === Wafer acceptance test (WAT) results are the basis of shipping wafers to foundry customers. The fundamental parameters of WAT, such as capacitance, voltage, resistance …etc., are employed to verify IC’s function. The purpose of WAT is to response the wafer product...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/77012654885112229259 |