| Summary: | 碩士 === 吳鳳技術學院 === 光機電暨材料研究所 === 97 === The microstructures and microwave dielectric properties of the (Mg(1-X)Zn(x))2TiO4 ceramic were investigated. The X-ray diffraction (XRD) patterning and scanning electron microscopy (SEM) analysis were also employed to study the crystal structures and microstructures of the (Mg(1-X)Zn(x))2TiO4 ceramic. This ceramics material required sintering temperatures from 1190 to 1310℃. As the x value is 0.06, the (Mg(1-X)Zn(x))2 TiO4 system has the dielectric properties as follows: a dielectric constant (εr) = 14.6, a Q × f value ~ 98,127 GHz (at 12 GHz), density 3.5 g/cm3 and a τf value of ~ -52 ppm/℃ was obtained for (Mg0.94Zn0.06)TiO4 ceramics sintered at 1250℃ for 6 hr.
Beside, we fabricated a cross-coupling bandpass filter on both (Mg(1-x)Zn(x))2TiO4 substrate and FR4 substrate. They were designed and simulated by Ansoft HFSS. As a result, it is found that the (Mg(1-x)Zn(x))2TiO4 substrate have a higher Qxf value and higher dielectric constant with smaller filter size and better frequency respond then FR4.
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