Effects of Sintering Process on the Dielectric Property of BME-X7R-MLCCs

• Main Authors: Tzu-Yu Shiao, 蕭子瑜
• Other Authors: Sea-Fue Wang
• Format: Others
• Language: zh-TW
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/jx68tw

碩士 === 國立臺北科技大學 === 材料科學與工程研究所 === 97 === Multi-Layer Ceramic Capacitors (MLCCs) are widely applied on the electronic products of the important electronic component and can conforme to X7R characteristic of the EIA standard (-55~125 oC，ΔC/C≦±15%). On account of its temperature dependency of capacitance stabilizes, and high dielectric constant properties is highly respected. At present, MLCC is made from the process of Base-Metal-Electrode with Ni electrode but Ni is easy to be oxidized and lead to unstable electrical property. Therefore, the process of burn out, sintering and annealing are widely attention-attrocted and dissussed. In this study, the insufficiency of sintering time, the increase of sintering temperature, and the inadequate of annealing temperature or annealing time cause unstable of tanδ and TCC. The TCCs rotate clockwise as the active thickness in MLCCs is reduced. For SEM analysis, all the microstructure all have second phase of MgO and core-shell structure. By XRD and Raman analysis, we can observe effects of different oxygen partial pressure on the lattice structure barium titanate.