The Development and Research of an Automatic Defects Inspection System for High Brightness Light Emitting Diode
碩士 === 國立臺灣科技大學 === 高分子系 === 97 === This study presents our proposed automatic defect inspection system for LEDs that applies various image processing methods on items including normal chips, chip fragment, scratch mark defect of the pad area, remained gold defect of pad areas, scratch mark defects...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/04658130644657445416 |