On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization

博士 === 國立清華大學 === 奈米工程與微系統研究所 === 97 === MEMS-based connectors, manufactured for various applications in industry, are often criticized for problems such as the wearing effect, the poor signal integrity, the EMI prevention for high-speed signal transmission, and the lack of latch design. In this the...

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Main Authors: Jang, Ben-Hwa, 章本華
Other Authors: Fang, Weileun
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/55321126925423622829
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spelling ndltd-TW-097NTHU57950042015-11-20T04:19:10Z http://ndltd.ncl.edu.tw/handle/55321126925423622829 On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization 零插入力微型連接器:設計、製作、量測與特性探討 Jang, Ben-Hwa 章本華 博士 國立清華大學 奈米工程與微系統研究所 97 MEMS-based connectors, manufactured for various applications in industry, are often criticized for problems such as the wearing effect, the poor signal integrity, the EMI prevention for high-speed signal transmission, and the lack of latch design. In this thesis a novel zero-insertion-force (ZIF) micro(μ)-connector and its characterization were presented. The characterization included the design, fabrication, analysis, and quantitative evaluation. The proposed ZIF μ-connector has been shown to remedy these problems. Potential applications of the ZIF μ-connector were addressed. Contact resistance for MEMS-based devices has been investigated. In particular, a micromachined testing device, designed for the removal of the parasitic resistance, was used to more precisely analyze the relationships among the contact force, the contact resistance, and the contact surface across multiple contact cycles. Error propagation analysis has been conducted to evaluate the accuracy of the measured properties. Fang, Weileun 方維倫 2009 學位論文 ; thesis 152 zh-TW
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language zh-TW
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description 博士 === 國立清華大學 === 奈米工程與微系統研究所 === 97 === MEMS-based connectors, manufactured for various applications in industry, are often criticized for problems such as the wearing effect, the poor signal integrity, the EMI prevention for high-speed signal transmission, and the lack of latch design. In this thesis a novel zero-insertion-force (ZIF) micro(μ)-connector and its characterization were presented. The characterization included the design, fabrication, analysis, and quantitative evaluation. The proposed ZIF μ-connector has been shown to remedy these problems. Potential applications of the ZIF μ-connector were addressed. Contact resistance for MEMS-based devices has been investigated. In particular, a micromachined testing device, designed for the removal of the parasitic resistance, was used to more precisely analyze the relationships among the contact force, the contact resistance, and the contact surface across multiple contact cycles. Error propagation analysis has been conducted to evaluate the accuracy of the measured properties.
author2 Fang, Weileun
author_facet Fang, Weileun
Jang, Ben-Hwa
章本華
author Jang, Ben-Hwa
章本華
spellingShingle Jang, Ben-Hwa
章本華
On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
author_sort Jang, Ben-Hwa
title On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
title_short On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
title_full On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
title_fullStr On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
title_full_unstemmed On a Zero-insertion-force Micro-connctor: Design, Fabrication, Measurements, and Characterization
title_sort on a zero-insertion-force micro-connctor: design, fabrication, measurements, and characterization
publishDate 2009
url http://ndltd.ncl.edu.tw/handle/55321126925423622829
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