Process Study of High-k Gate Stack Dielectrics and Interfacial layer for MOS Devices

碩士 === 國立清華大學 === 工程與系統科學系 === 97 ===

Bibliographic Details
Main Authors: Wu, Dong-Yi, 吳東益
Other Authors: Chang-Liao, Kuei-Shu
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/15838352185363723747