Scan Architecture Supporting Low Power Test Compression and Easy Diagnosis
博士 === 國立清華大學 === 電機工程學系 === 97 === Scan test has been an indispensable test methodology for guaranteeing test quality in industry. However, as the designs become larger and larger, the cost of scan test has been skyrocketing as the test data volume grows prohibitively high and thus increasing the t...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/23127442066816387353 |