Improving Testing and Diagnosis Efficiency of Regular Memory Arrays
碩士 === 國立清華大學 === 電機工程學系 === 97 === Embedded memory cores are widely used in the SOC, and the area percentage of embedded memory cores in the SOC is growing rapidly. Since the high density and capacity of embedded memory cells, the probability of faulty bits is high and the chip yield will be affect...
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25901583105928766445 |