Indirect-Access Scan Test over HOY Test Platform
碩士 === 國立清華大學 === 電機工程學系 === 97 === In this thesis, we introduce a new test paradigm called indirect-access scan test, demonstrated over the HOY test platform. Unlike the traditional ATE-based testing, the test data in this paradigm are sent to the chip under test via packets over a single indirect...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/50312741426445074639 |