Optical Analysis of Optoelectronic films with Spectroscopic Ellipsometry

Optical Analysis of Optoelectronic films with Spectroscopic Ellipsometry

碩士 === 國立清華大學 === 材料科學工程學系 === 97 ===

Bibliographic Details
Main Authors:	Liu, Yu-Hsin, 劉宇欣
Other Authors:	Gan, Jon-Yiew
Format:	Others
Language:	zh-TW
Published:	2009
Online Access:	http://ndltd.ncl.edu.tw/handle/43766448929165330434

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