| Summary: | 碩士 === 國立屏東科技大學 === 工業管理系所 === 97 === TFT-LCD is one of the major products in the display industry. It is capital intensive and relatively high technology oriented. An LCD plant of any generation would cost more than ten billion TWD. Therefore , the yield rate would heavily dominate and decide a winner in TFT-LCD industry. In conjunction with complex LCD manufacturing processes, the chance of having higher defective rate can be foreseen. Thus, how to decrease defective rate becomes the key issue to maintain the competitive edge in LCD industry .
This thesis uses the DMAIC process of Six-Sigma for H company to efficiently enhance and improve Omission Factor of final inspection in TFT-LCD production. This research first studies the important criteria of customer specifications and requirements. Then the auther uses Gauge R&R to evaluate the reliability of measurement. Furthermore , 1P and ANOVA conclude those factors which can significantly affect Omission Factor, such as the height of QA inspector or visual observation distance, etc. For defining the specific process to be improved, design of experiments (DOE) consolidates causes A breakthrough results of annual cost saving of eleven million on material and labor waste in the final inspection is achieved.
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