Growth and Characterization of Ga2(Se1-xTex)3

Growth and Characterization of Ga2(Se1-xTex)3

碩士 === 國立東華大學 === 電子工程研究所 === 97 === Crystals of Ga2(Se1-xTex)3 compounds with x = 0, 0.2, 0.4, 0.6, 0.8 and were grown by vertical Bridgman method. The crystalline phase and stoichiometry of these crystals were investigated by X-ray diffraction, SEM, Raman spectroscopy and EPMA techniques. X-ray ph...

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Bibliographic Details
Main Authors:	Shi-Shian Huang, 黃世賢
Other Authors:	Ching-Cherng Wu
Format:	Others
Language:	zh-TW
Published:	2009
Online Access:	http://ndltd.ncl.edu.tw/handle/36033319446540781065

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