Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples
碩士 === 國立嘉義大學 === 應用數學系研究所 === 97 === In the service (or manufacturing) industries, process capability indices (PCIs) are utilized to measure process potential and performance. And the lifetime performance index (or large-the-better process capability index) is also important and fre-quently used...
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ndltd-TW-097NCYU55070012015-11-16T16:09:08Z http://ndltd.ncl.edu.tw/handle/95391229477772412369 Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples 在K組型II雙設限樣本下探討指數產品的壽命性能指標之檢定程序 Kai-Tsung, Huang 黃凱聰 碩士 國立嘉義大學 應用數學系研究所 97 In the service (or manufacturing) industries, process capability indices (PCIs) are utilized to measure process potential and performance. And the lifetime performance index (or large-the-better process capability index) is also important and fre-quently used as a means of measuring product performance, where is the lower specification limit. We will discuss the lifetime of products generally follow an expo-nential distribution in this thesis. We propose an estimator of the lifetime performance index based on the best linear unbiased estimator (BLUE) for the scale parameter of an exponential distribution with the doubly type II censored K-samples. Then this es-timator of the lifetime performance index is also utilized to develop the hypothesis testing procedure in the condition of known L. Finally, we give four practical exam-ples to illustrate the testing procedure. Furthermore, we find that our method is better than Wang (2007)’s method based on the power of this test. Jong-Wuu, Wu Hung-Yu, Pan 吳忠武 潘宏裕 2009 學位論文 ; thesis 89 en_US |
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Others
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碩士 === 國立嘉義大學 === 應用數學系研究所 === 97 === In the service (or manufacturing) industries, process capability indices (PCIs) are utilized to measure process potential and performance. And the lifetime performance index (or large-the-better process capability index) is also important and fre-quently used as a means of measuring product performance, where is the lower specification limit. We will discuss the lifetime of products generally follow an expo-nential distribution in this thesis. We propose an estimator of the lifetime performance index based on the best linear unbiased estimator (BLUE) for the scale parameter of an exponential distribution with the doubly type II censored K-samples. Then this es-timator of the lifetime performance index is also utilized to develop the hypothesis testing procedure in the condition of known L. Finally, we give four practical exam-ples to illustrate the testing procedure. Furthermore, we find that our method is better than Wang (2007)’s method based on the power of this test.
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author2 |
Jong-Wuu, Wu |
author_facet |
Jong-Wuu, Wu Kai-Tsung, Huang 黃凱聰 |
author |
Kai-Tsung, Huang 黃凱聰 |
spellingShingle |
Kai-Tsung, Huang 黃凱聰 Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
author_sort |
Kai-Tsung, Huang |
title |
Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
title_short |
Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
title_full |
Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
title_fullStr |
Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
title_full_unstemmed |
Testing procedure for lifetime performance index of exponential products based on doubly type II censored K-samples |
title_sort |
testing procedure for lifetime performance index of exponential products based on doubly type ii censored k-samples |
publishDate |
2009 |
url |
http://ndltd.ncl.edu.tw/handle/95391229477772412369 |
work_keys_str_mv |
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