Measurement of optical thin film constants using dynamic interferometer
碩士 === 國立中央大學 === 光電科學研究所 === 97 === In this thesis, we proposed a polarize phase shifting interferometer based on Twyman-Green interferometer structure which is used to measure the thin film optical admittance, and the refractive index and thickness of single layer thin film can be derived directly...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56151392864163166449 |