On Distinguishing Process Corner for Yield Improvement in Memory Compiler Generated SRAM
碩士 === 國立交通大學 === 電子工程系所 === 97 === As the technology scales down to nanometer, the yield degradation caused by inter-die variations is getting worse. Using adaptive body bias is an effective method to eliminate the yield degradation, however we need to know a die having high threshold voltage or lo...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/13124971355873543191 |