Design and Development of an Automated Visual Inspection System for Die Surface Defects
碩士 === 國立交通大學 === 工業工程與管理系所 === 97 === Product quality is an important factor in semiconductor manufacturing. Therefore, die defect inspection is an important quality control process before packaging. Conventionally, the inspection of die surface defects by human observation is labor intensive. It r...
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ndltd-TW-097NCTU50310622015-10-13T15:42:32Z http://ndltd.ncl.edu.tw/handle/73552165301373767638 Design and Development of an Automated Visual Inspection System for Die Surface Defects 晶粒表面缺陷自動視覺檢測系統之設計與開發 Chang, Yuan-Shuo 張元碩 碩士 國立交通大學 工業工程與管理系所 97 Product quality is an important factor in semiconductor manufacturing. Therefore, die defect inspection is an important quality control process before packaging. Conventionally, the inspection of die surface defects by human observation is labor intensive. It results in low efficiency and inaccuracy. This research is to design and develop an automated visual inspection system for die surface defects by using the machine vision technology. The mainly focused inspection items of dice are particles, contaminations, pad missing, pad damage, discoloration, and passivation. A prototype of the automated visual inspection system for die surface defect inspection will be implemented for inspection efficiency, cost down, and full-inspection. Perng, Der-Baau 彭德保 2009 學位論文 ; thesis 51 zh-TW |
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碩士 === 國立交通大學 === 工業工程與管理系所 === 97 === Product quality is an important factor in semiconductor manufacturing. Therefore, die defect inspection is an important quality control process before packaging. Conventionally, the inspection of die surface defects by human observation is labor intensive. It results in low efficiency and inaccuracy.
This research is to design and develop an automated visual inspection system for die surface defects by using the machine vision technology. The mainly focused inspection items of dice are particles, contaminations, pad missing, pad damage, discoloration, and passivation.
A prototype of the automated visual inspection system for die surface defect inspection will be implemented for inspection efficiency, cost down, and full-inspection.
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author2 |
Perng, Der-Baau |
author_facet |
Perng, Der-Baau Chang, Yuan-Shuo 張元碩 |
author |
Chang, Yuan-Shuo 張元碩 |
spellingShingle |
Chang, Yuan-Shuo 張元碩 Design and Development of an Automated Visual Inspection System for Die Surface Defects |
author_sort |
Chang, Yuan-Shuo |
title |
Design and Development of an Automated Visual Inspection System for Die Surface Defects |
title_short |
Design and Development of an Automated Visual Inspection System for Die Surface Defects |
title_full |
Design and Development of an Automated Visual Inspection System for Die Surface Defects |
title_fullStr |
Design and Development of an Automated Visual Inspection System for Die Surface Defects |
title_full_unstemmed |
Design and Development of an Automated Visual Inspection System for Die Surface Defects |
title_sort |
design and development of an automated visual inspection system for die surface defects |
publishDate |
2009 |
url |
http://ndltd.ncl.edu.tw/handle/73552165301373767638 |
work_keys_str_mv |
AT changyuanshuo designanddevelopmentofanautomatedvisualinspectionsystemfordiesurfacedefects AT zhāngyuánshuò designanddevelopmentofanautomatedvisualinspectionsystemfordiesurfacedefects AT changyuanshuo jīnglìbiǎomiànquēxiànzìdòngshìjuéjiǎncèxìtǒngzhīshèjìyǔkāifā AT zhāngyuánshuò jīnglìbiǎomiànquēxiànzìdòngshìjuéjiǎncèxìtǒngzhīshèjìyǔkāifā |
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