| Summary: | 碩士 === 國立成功大學 === 物理學系碩博士班 === 97 === In this paper, we develop a microwave interferometry system for plasma diagnostics..
First, we discuss the EM wave propagation in magnetized plasma. The dispersion relation of EM wave will be changed by the angle between the magnetic field and EM wave propagation direction, so we can use it to measure and calculate the plasma density. Because our magnetized plasma system is still not operative, we instead measure the dielectric constant of Teflon to test and verify our interferometry system. We also use the network analyzer to confirm the accuracy of interferometry. Finally, we consider the future work of the microwave interferometry for plasma diagnostics.
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