Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes

碩士 === 國立中興大學 === 精密工程學系所 === 97 === In this thesis, the internal quantum efficiency of the InGaN-based light emitting diodes were analyzed through dependent micro-photoluminescence (μ-PL) spectrum, bias-dependent μ-PL spectrum, and lower-current injection μ-PL spectrum by varying the temperature fr...

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Main Authors: Jhan-Hong Ye, 葉展宏
Other Authors: 林佳鋒
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/40813403346696696032
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spelling ndltd-TW-097NCHU56930112016-04-29T04:20:02Z http://ndltd.ncl.edu.tw/handle/40813403346696696032 Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes 圖案化氮化鎵發光元件之外部量子效率分析 Jhan-Hong Ye 葉展宏 碩士 國立中興大學 精密工程學系所 97 In this thesis, the internal quantum efficiency of the InGaN-based light emitting diodes were analyzed through dependent micro-photoluminescence (μ-PL) spectrum, bias-dependent μ-PL spectrum, and lower-current injection μ-PL spectrum by varying the temperature from 10K to 300K. The IQE measurements under the lower injection current and the applying bias voltages conditions were reasonable for the actual operating LEDs. During the bias-dependent μ-PL measurement, the injection current induced EL emission at forward voltage, and the tunneling current induced leakage current at reverse voltage are affected the μ-PL measurement and the calculated IQE values. The LED operated at the open circuit condition (Voc, zero current condition) had the reasonable IQE values compared to the conventional temperature-dependent μ-PL measurement. For the EL IQE measurement, the ratio of between the EL intensity at RT to peak EL intensity by varying the temperature was defined as the EL IQE value. The IQE values in different LED structures were analyzed through the temperature-dependent PL and EL measurements. 林佳鋒 學位論文 ; thesis 56 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中興大學 === 精密工程學系所 === 97 === In this thesis, the internal quantum efficiency of the InGaN-based light emitting diodes were analyzed through dependent micro-photoluminescence (μ-PL) spectrum, bias-dependent μ-PL spectrum, and lower-current injection μ-PL spectrum by varying the temperature from 10K to 300K. The IQE measurements under the lower injection current and the applying bias voltages conditions were reasonable for the actual operating LEDs. During the bias-dependent μ-PL measurement, the injection current induced EL emission at forward voltage, and the tunneling current induced leakage current at reverse voltage are affected the μ-PL measurement and the calculated IQE values. The LED operated at the open circuit condition (Voc, zero current condition) had the reasonable IQE values compared to the conventional temperature-dependent μ-PL measurement. For the EL IQE measurement, the ratio of between the EL intensity at RT to peak EL intensity by varying the temperature was defined as the EL IQE value. The IQE values in different LED structures were analyzed through the temperature-dependent PL and EL measurements.
author2 林佳鋒
author_facet 林佳鋒
Jhan-Hong Ye
葉展宏
author Jhan-Hong Ye
葉展宏
spellingShingle Jhan-Hong Ye
葉展宏
Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
author_sort Jhan-Hong Ye
title Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
title_short Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
title_full Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
title_fullStr Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
title_full_unstemmed Analyzed the external quantum efficiency of patterned GaN-based light-emitting diodes
title_sort analyzed the external quantum efficiency of patterned gan-based light-emitting diodes
url http://ndltd.ncl.edu.tw/handle/40813403346696696032
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