The RFID technique integrated the IC test fixture system

• Main Authors: Chih-Jen Yang, 楊智任
• Other Authors: Gwo-Jia Jong
• Format: Others
• Language: zh-TW
• Published: 2009
• Online Access: http://ndltd.ncl.edu.tw/handle/00559584676378027736

碩士 === 國立高雄應用科技大學 === 電子工程系 === 97 === In recent years, radio frequency identification (RFID) system has been gradually paid munch attention to embed on semiconductor process technique application. The RFID technique is combined the identification network system with semiconductor product test. The system can be physically adopted to operate at the ubiquitous communication and integration environments. In this thesis, the RFID system is integrated into semiconductor process, which is provided to solve and manage the product design, semiconductor process and the system integrated environment using software and hardware test system. The integrated system is also conducted the semiconductor test and operation process to the NXP-APK company. The contributions of this thesis are not only decreased the product cost but also enhanced the product test yield to achieve the important target of economics.