Apply Machine Vision Techniques to Defect Detection forBi-stable Cholesteric Liquid CrystalDisplays

碩士 === 中原大學 === 機械工程研究所 === 97 === Bi-stable cholesteric liquid crystal display (BS-ChLCD) is a novel display technology with characteristic of light, high contrast, bendable, energy saving, and memorability. Recently, a consumer revolution in people’s way of reading is caused by Paper-Like flexible...

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Bibliographic Details
Main Authors: Chao-Neng Hsueh, 薛昭能
Other Authors: Yi-Hung Liu
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/67765123694707938703
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Summary:碩士 === 中原大學 === 機械工程研究所 === 97 === Bi-stable cholesteric liquid crystal display (BS-ChLCD) is a novel display technology with characteristic of light, high contrast, bendable, energy saving, and memorability. Recently, a consumer revolution in people’s way of reading is caused by Paper-Like flexible display with portable and mobility. However, the key components and materials have yet been exploited really perfect. Furthermore, the performance of displays would be affected by the production imperfections. Therefore, in the research, the Machine Vision System would be applied to inspect the exterior defect with three mechanisms: Vision Pre-processing, Training Procedure, and Inspecting Procedure. The proposed system is based on Support Vector Machine (SVM) to decompose an original image to several sub-images then processing the defect classified mechanisms. The original images are not full horizontal; it is very difficult to reconstruct the background patterns with this kind of horizontal error. Nonetheless, the Vision Pre-processing systems have to tune the original images to full horizontal for following inspection procedure. The Training Procedure mechanism is construction of Texture, Variance, Singular Value Decomposition (SVD), and Principal Component Analysis (PCA), according to the analysis results, each sub-images are with unique eigenvector. The proposed systems build a defect inspection model via those eigenvectors based on SVM. In this model, each original image would be split up into sub-images and input the eigenvector set calculated from those sub-images for defect judgments. Proceed to the next step, remark the sub-images if the defect was found. After processing all sub-images, the model would show the inspection result of defect judgments. According to the experiment result showed in this work, the recognition rate of proposed system is 99.04%.