Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example
碩士 === 中原大學 === 企業管理研究所 === 97 === Semiconductor industries development starting from 1960, driving IC manufacturing industries to go, too. Memory industries of Taiwan occupy the position of importance in the world, moreover, memory module testing processing is much more miscellaneous and complica...
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ndltd-TW-097CYCU54570672015-10-13T12:04:54Z http://ndltd.ncl.edu.tw/handle/68584679459079929579 Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example 提昇記憶體模組測試績效之研究—以P公司之整合式測試平台系統為例— Wen-Cheng Chan 詹文誠 碩士 中原大學 企業管理研究所 97 Semiconductor industries development starting from 1960, driving IC manufacturing industries to go, too. Memory industries of Taiwan occupy the position of importance in the world, moreover, memory module testing processing is much more miscellaneous and complicated in the industry, if the autonomy of technology or the fit testing platform can be built in the testing operation, the operation efficiency and the product cost will be reduced and the ability to get order from customer will be promoted, that is, the competitiveness in the memory industries will be upgraded all over the world. Based on the reason as above. The discussion research of the “Integrated Testing Platform” which is constructed by the CIM theory impacts on testing effectiveness of memory module in manufacturing. The key successful factors and performance evaluation will be discussed in the beginning, then what is the memory and how memory module to make and test which are introduced, then CIM and the technologies containing XML and Web Services which are used to construct the platform will be described and the construction process will be expressed in complete. A case study is adopted as the method of experimental design, by means of the results, the impacts on the client company’s testing performance of memory module by the implementing of “Integrated Testing Platform” will be discussed. Based on the client, three approaches are used to evaluate the “Integrated Testing Platform” if will be benefit to upgrade the testing performance, they are: 1.operational error, 2.testing efficiency and 3.testing yield. By means of the analysis of the experimental design, we will find out that all of three approaches have significant impacts on the testing performance, containing decreasing the operational error, upgrading testing yield and decreasing the testing time. Besides, the implemental cost of Integrated Testing Platform is not expensive but it is work to upgrade the testing performance. As the result, the testing performance can strengthen the operational management and the competition of the business. Shy-Der Lin 林賜德 2009 學位論文 ; thesis 73 zh-TW |
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碩士 === 中原大學 === 企業管理研究所 === 97 === Semiconductor industries development starting from 1960, driving IC manufacturing industries to go, too. Memory industries of Taiwan occupy the position of importance in the world, moreover, memory module testing processing is much more miscellaneous and complicated in the industry, if the autonomy of technology or the fit testing platform can be built in the testing operation, the operation efficiency and the product cost will be reduced and the ability to get order from customer will be promoted, that is, the competitiveness in the memory industries will be upgraded all over the world. Based on the reason as above. The discussion research of the “Integrated Testing Platform” which is constructed by the CIM theory impacts on testing effectiveness of memory module in manufacturing.
The key successful factors and performance evaluation will be discussed in the beginning, then what is the memory and how memory module to make and test which are introduced, then CIM and the technologies containing XML and Web Services which are used to construct the platform will be described and the construction process will be expressed in complete. A case study is adopted as the method of experimental design, by means of the results, the impacts on the client company’s testing performance of memory module by the implementing of “Integrated Testing Platform” will be discussed. Based on the client, three approaches are used to evaluate the “Integrated Testing Platform” if will be benefit to upgrade the testing performance, they are: 1.operational error, 2.testing efficiency and 3.testing yield.
By means of the analysis of the experimental design, we will find out that all of three approaches have significant impacts on the testing performance, containing decreasing the operational error, upgrading testing yield and decreasing the testing time. Besides, the implemental cost of Integrated Testing Platform is not expensive but it is work to upgrade the testing performance. As the result, the testing performance can strengthen the operational management and the competition of the business.
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author2 |
Shy-Der Lin |
author_facet |
Shy-Der Lin Wen-Cheng Chan 詹文誠 |
author |
Wen-Cheng Chan 詹文誠 |
spellingShingle |
Wen-Cheng Chan 詹文誠 Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
author_sort |
Wen-Cheng Chan |
title |
Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
title_short |
Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
title_full |
Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
title_fullStr |
Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
title_full_unstemmed |
Research of Memory Module Testing Performance– Using Integrated Testing Platform System of P Company As Example |
title_sort |
research of memory module testing performance– using integrated testing platform system of p company as example |
publishDate |
2009 |
url |
http://ndltd.ncl.edu.tw/handle/68584679459079929579 |
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